Reedholm test systems are primarily used for in-line and end-of-line collection of DC test data.
Reliability testing stresses and measures test structure degradation as a function of time.
State of the art and diverse system software enables Reedholm test systems to satisfy a variety of semiconductor DC test applications.
Numerous test system accessories are available for prober interfacing, system maintenance, system upgrades, etc.
Reedholm instrumentation addresses the gamut of semiconductor industry testing needs, and capabilities are added and/or developed to address unique customer needs.